Automatic functional testing services for integrated circuits under JEDEC standards.
GS Nanotech offers services for Automatic functional and structural testing for integrated circuits.
We offer our expertise in testing circuits:
Equipment: Teradyne UltraFlex
|Test data rate||200 MHz|
|Vector memory depth||32 М|
|Digital I/O, channel||768|
- source, channel
- capture, channel
|Parallel testing||up to 9 DUTs|
|Temperature range||-60 / +160|
The finished products can be subject to laser marking, packed in a blister strip or trays and transported to customers.