Leading microelectronics manufacturing, packaging and testing companies


Automatic functional testing services for integrated circuits under JEDEC standards.

GS Nanotech offers services for Automatic functional and structural testing for integrated circuits.

We offer our expertise in testing circuits:

  • Digital
  • Mixed Signal
  • Analog
  • SoC

Equipment: Teradyne UltraFlex


Test data rate 200 MHz
Vector memory depth 32 М
Digital I/O, channel 768
- source, channel
- capture, channel

DPS, channel 80
Parallel testing up to 9 DUTs
Temperature range -60 / +160

The finished products can be subject to laser marking, packed in a blister strip or trays and transported to customers.