Automatic functional testing services for integrated circuits under JEDEC standards.
GS Nanotech offers services for Automatic functional and structural testing for integrated circuits.
We offer our expertise in testing circuits:
Equipment: Teradyne UltraFlex
Test data rate | 200 MHz |
Vector memory depth | 32 М |
Digital I/O, channel | 768 |
Analog: - source, channel - capture, channel |
8 8 |
DPS, channel | 80 |
Parallel testing | up to 9 DUTs |
Temperature range | -60 / +160 |
The finished products can be subject to laser marking, packed in a blister strip or trays and transported to customers.